Symmetry-aware recursive image similarity exploration for materials microscopy

Depth profiling of PZT thin film. (a) ToF-SIMS depth profiles; (b) AFM

Understanding Symmetry and Speed Materials Research with a Novel Neural Network - Assignment Point

PDF] Unsupervised learning of ferroic variants from atomically resolved STEM images

PDF] Microscopy is All You Need

Ruijuan Xu NC State MSE

Symmetry-aware recursive image similarity exploration for materials microscopy

Applied Sciences, Free Full-Text

Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy Data, Microscopy and Microanalysis

Бекенстейн Ехонадав

Symmetry-aware recursive image similarity exploration for materials microscopy

Scientists create artificial neural networks that detect symmetry and patterns